发明名称 |
System and Method for Contact Measurement Circuit |
摘要 |
According to an embodiment, a contact measurement circuit is configured to be coupled between a first contact and a second contact, and the contact measurement circuit includes a first transistor, a control capacitor, and a voltage measurement unit. The first transistor includes a first conduction terminal configured to be coupled to the first contact, a second conduction terminal, and a first control terminal. The control capacitor includes a first capacitor terminal coupled to the second conduction terminal and a second capacitor terminal coupled to the first control terminal. The voltage measurement unit is coupled to the first capacitor terminal and the second capacitor terminal, and the second capacitor terminal is configured to be coupled to the second contact. |
申请公布号 |
US2016169945(A1) |
申请公布日期 |
2016.06.16 |
申请号 |
US201414569418 |
申请日期 |
2014.12.12 |
申请人 |
Infineon Technologies Austria AG |
发明人 |
Mauder Anton;Barrenscheen Jens |
分类号 |
G01R19/165;G01R19/00 |
主分类号 |
G01R19/165 |
代理机构 |
|
代理人 |
|
主权项 |
1. A contact measurement circuit configured to be coupled between a first contact and a second contact, the contact measurement circuit comprising:
a first transistor comprising a first conduction terminal configured to be coupled to the first contact, a second conduction terminal, and a first control terminal; a control capacitor comprising a first capacitor terminal coupled to the second conduction terminal and a second capacitor terminal coupled to the first control terminal, wherein the second capacitor terminal is configured to be coupled to the second contact; and a voltage measurement unit coupled to the first capacitor terminal and the second capacitor terminal. |
地址 |
Villach AT |