发明名称 |
Method and apparatus of boundary scan testing for AC-coupled differential data paths |
摘要 |
Boundary scan testing methods that detect manufacturing defects in AC-coupled differential pairs may be based on a selected signal parameter: phase or frequency. The data is encoded by the signal parameter. In one embodiment, the signal parameter is compared to reference parameter data provided by the transmitter. In a second embodiment, the reference parameter data is sent from an external source. All the components on board are synchronized with this external source. In a third embodiment, the reference parameter data is embedded in each AC signal between the transmitter and receiver. Two lines of one differential link are used to send different patterns.
|
申请公布号 |
US2002170011(A1) |
申请公布日期 |
2002.11.14 |
申请号 |
US20010851731 |
申请日期 |
2001.05.09 |
申请人 |
LAI BENNY W. H.;KIM YOUNG GON;PARKER KENNETH P.;REARICK JEFF |
发明人 |
LAI BENNY W. H.;KIM YOUNG GON;PARKER KENNETH P.;REARICK JEFF |
分类号 |
G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3185 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|