发明名称 Method and apparatus of boundary scan testing for AC-coupled differential data paths
摘要 Boundary scan testing methods that detect manufacturing defects in AC-coupled differential pairs may be based on a selected signal parameter: phase or frequency. The data is encoded by the signal parameter. In one embodiment, the signal parameter is compared to reference parameter data provided by the transmitter. In a second embodiment, the reference parameter data is sent from an external source. All the components on board are synchronized with this external source. In a third embodiment, the reference parameter data is embedded in each AC signal between the transmitter and receiver. Two lines of one differential link are used to send different patterns.
申请公布号 US2002170011(A1) 申请公布日期 2002.11.14
申请号 US20010851731 申请日期 2001.05.09
申请人 LAI BENNY W. H.;KIM YOUNG GON;PARKER KENNETH P.;REARICK JEFF 发明人 LAI BENNY W. H.;KIM YOUNG GON;PARKER KENNETH P.;REARICK JEFF
分类号 G01R31/3185;(IPC1-7):G01R31/28 主分类号 G01R31/3185
代理机构 代理人
主权项
地址