发明名称 MASK INSPECTION APPARATUS AND METHOD
摘要 Apparatus for optical inspection of an object, comprising: an optical imaging system (5) for generating an actual image of the real object, a calculation unit (12) for calculating an estimated image of an object of desired shape in respect of a known aberration coefficient of the optical imaging system, an image analysis unit (13) for detecting differences between the actual image and the image calculated by the calculation unit (12).
申请公布号 KR20060132680(A) 申请公布日期 2006.12.21
申请号 KR20067015724 申请日期 2006.08.03
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 DIRKSEN PETER;STEFFEN THOMAS
分类号 G01B11/00;G03F1/00 主分类号 G01B11/00
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