发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
Methods for forming semiconductor memory structures including air gaps between adjacent gate structures are provided. The volume of the air gaps is maximized and the width thereof made uniform in order to minimize the parasitic capacitance and any variance therein between the gate structures. The methods include forming an insulation layer between adjacent gate structures and subsequently etching the insulation layer to leave an air gap. Devices fabricated in accordance with the methods are also provided.
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申请公布号 |
US2007096202(A1) |
申请公布日期 |
2007.05.03 |
申请号 |
US20060551680 |
申请日期 |
2006.10.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG DAE-WOONG;CHANG SUNG-NAM;KIM JIN-JOO;LEE KYONG-JOO;LEE EUN-JUNG |
分类号 |
H01L29/792 |
主分类号 |
H01L29/792 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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