发明名称 NONVOLATILE SEMICONDUCTOR STORAGE ELEMENT, AND NONVOLATILE SEMICONDUCTOR STORAGE DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor storage element and a nonvolatile semiconductor storage device capable of dispensing with verifying operation and actualizing more than two kinds of threshold voltages. <P>SOLUTION: The nonvolatile semiconductor storage element has: a semiconductor substrate; a semiconductor region 2c of a first conductivity type provided in the semiconductor substrate; source and drain regions 2a and 2b of a second conductivity type provided apart from each other; a first insulating layer 3 provided between the source and drain regions; a charge storage layer 4 which has a layered structure provided on the first insulating layer and including at least four layers of conductor films 4a, 4c, 4e, and 4g and inter-conductor insulating films 4b, 4d, and 4f provided between conductor films, wherein a dielectric constant of an inter-conductor insulating film disposed away from the semiconductor substrate is higher than a dielectric constant of an inter-conductor insulating film disposed nearby the semiconductor substrate and dielectric constants of any of the inter-conductor insulating films is lower than the dielectric constant of the first insulating layer 3; a second insulating layer 5 provided on the charge storage layer and having a higher dielectric constant than that of any of the inter-conductor insulating films; and a conductor layer 6. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008311325(A) 申请公布日期 2008.12.25
申请号 JP20070155919 申请日期 2007.06.13
申请人 TOSHIBA CORP 发明人 ONO TAMAKI
分类号 H01L21/8247;G11C16/02;G11C16/04;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/8247
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