发明名称 STIMULATED SCINTILLATION EMISSION DEPLETION (SSED) FOR HIGH-RESOLUTION QUANTITATIVE X-RAY NANOIMAGING
摘要 The present invention suggests a new method for generating high spatial resolution X-ray images of an object. Differently than other existing X-ray imaging setups, our configuration employs stimulated scintillation emission depletion and improves the spatial resolution beyond the diffraction limit of conventional scintillation emission. In our new method, X-rays (2) passing through an object (3) are partially absorbed by a luminescence screen (5). The emission of the luminescence screen (5) generates an image of the object (3). A de- excitation light (8) comprising zero-intensity point in at least one focal area is applied to the luminescence screen (5). This light de-excites the excited luminescence centers leaving sub-diffraction sized spots of the spontaneously emitted scintillation, which is registered by a photodetector (15). The image of the object (3) in the luminescence screen (5) is scanned, and a two-dimensional X-ray image of one projection is reconstructed. By measuring different two-dimensional projections, a three-dimensional image of the object is reconstructed.
申请公布号 WO2016192882(A1) 申请公布日期 2016.12.08
申请号 WO2016EP58348 申请日期 2016.04.15
申请人 PAUL SCHERRER INSTITUT 发明人 ALEKHIN, Mikhail;STAMPANONI, Marco
分类号 G01T1/20 主分类号 G01T1/20
代理机构 代理人
主权项
地址