发明名称 Chemically amplified resist material and pattern formation method using the same
摘要 <p>In a pattern formation method, a resist film made of a chemically amplified resist material including a first polymer having hemiacetal or hemiketal is formed on a substrate. Then, with a liquid provided on the resist film, pattern exposure is performed by selectively irradiating the resist film with exposing light. After the pattern exposure, the resist film is developed so as to form a resist pattern made of the resist film.</p>
申请公布号 EP1734407(A2) 申请公布日期 2006.12.20
申请号 EP20060006301 申请日期 2006.03.27
申请人 PANASONIC CORPORATION 发明人 ENDO, MASAYUKI;SASAGO, MASARU
分类号 G03F7/039;C08L59/00;G03F7/20 主分类号 G03F7/039
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