DEVICE FOR MEASURING SUPERFINE PARTICLE MASSES

摘要

A device for measuring superfine particle masses, comprising an exposure system having at least two measurement chambers (1) with identical geometries, each comprising a deposition surface (4) for particles with a respective aerosol supply (9) directed toward said deposition surface, the aerosol supply having an outlet region (17) for the supply of an aerosol onto the deposition surface, wherein at least one of the deposition surfaces is formed on a piezoelectric crystal (5) as superfine weighing scale, and means for generating a potential difference between the particles in the gas and the deposition surfaces, wherein a potential of at most 50 V relative to ground potential is applied to each of the deposition surfaces, a grate is arranged over each of the deposition surfaces, and a potential with a potential difference of at least 200 V in relation to the potential of the deposition surfaces is applied to each of the grates, wherein an electric field is generated between the grates and the respective deposition surfaces.