发明名称 Temperature measurement device
摘要 A temperature measurement device includes a temperature measurement part, a calculation part, and a control part for controlling the operation of the temperature measurement part and the calculation part. The temperature measurement part has a substrate having a first surface as a contact surface with a measured body, and a second surface as an environment-lateral surface which is opposite the first surface, a first temperature sensor, a second temperature sensor, and a third temperature sensor, and the first temperature sensor. The second temperature sensor, and the third temperature sensor measure a first temperature, a second temperature, and a third temperature a plurality of times under conditions in which the temperature of the environment varies, and the calculation part calculates a deep temperature in a deep part of the measured body by using the measured temperatures.
申请公布号 US9528887(B2) 申请公布日期 2016.12.27
申请号 US201113270342 申请日期 2011.10.11
申请人 Seiko Epson Corporation 发明人 Shimizu Sakiko
分类号 G06F15/00;G01K13/00;G01K1/16;G01K7/42 主分类号 G06F15/00
代理机构 Global IP Counselors, LLP 代理人 Global IP Counselors, LLP
主权项 1. A temperature measurement device comprising: a substrate; a first temperature sensor configured to measure first temperature at a first measurement point positioned on an outer surface of the substrate or inside of the substrate; a second temperature sensor configured to measure second temperature at a second measurement point positioned on the outer surface of the substrate or inside of the substrate, the second measurement point being different from the first measurement point; and a third temperature sensor configured to measure third temperature at a third measurement point positioned on the outer surface of the substrate or inside of the substrate, the third measurement point being different from the first and second measurement points, the first temperature sensor, the second temperature sensor, and the third temperature sensor being configured to measure the first temperature, the second temperature, and the third temperature, respectively, at a plurality of times, the first temperature being expressed by a first linear function having a first slope and a first intercept, the second temperature being a variable in the first linear function, the first intercept of the first linear function being expressed by a second linear function having a second slope and a second intercept, the third temperature being a variable in the second linear function, a plurality of constants corresponding to the first slope, the second slope, and the second intercept, the first temperature sensor, the second temperature sensor, and the third temperature sensor measuring Tb1, Tp1, and Tout1′ as the first temperature, the second temperature, and the third temperature, respectively, during a first measurement, the first temperature sensor, the second temperature sensor, and the third temperature sensor measuring Tb2, Tp2, and Tout2′, as the first temperature, the second temperature, and the third temperature, respectively, during a second measurement, the first temperature sensor, the second temperature sensor, and the third temperature sensor measuring Tb3, Tp3, and Tout3′, respectively, as the first temperature, the second temperature, and the third temperature, during a third measurement, and the calculation part being configured to compute values of the first slope, the second slope, and the second intercept based on the first temperature Tb1, the second temperature Tp1, and the third temperature Tout1′ that are measured during by the first measurement, the first temperature Tb2, the second temperature Tp2, and the third temperature Tout2′ that are measured during the second measurement, and the first temperature Tb3, the second temperature Tp3, and the third temperature Tout3′ that measured during the third measurement, and determining a deep temperature in a deep part of a measured body based on a deep temperature calculation equation that uses the values of the first slope, the second slope, and the second intercept that are calculated.
地址 Tokyo JP