发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device achieving microfabrication with maintaining good characteristics at high yield. <P>SOLUTION: In a semiconductor device using an oxide semiconductor, contact resistance between the oxide semiconductor and source electrode/drain electrode is reduced with promoting microfabrication. In particular, by processing an oxide semiconductor film to form an island-shaped oxide semiconductor film having tapered lateral faces. A taper angle of the lateral face is not less than 1° and less than 10°. At least a part of the source electrode/drain electrode contacts the lateral face of the oxide semiconductor film. This configuration increases a contact region between the oxide semiconductor film and the source electrode/drain electrode thereby to reduce contact resistance. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013123044(A) |
申请公布日期 |
2013.06.20 |
申请号 |
JP20120246515 |
申请日期 |
2012.11.08 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
SASAGAWA SHINYA;FUJIKI HIROSHI |
分类号 |
H01L29/786;H01L21/28;H01L21/336;H01L21/8242;H01L21/8244;H01L21/8247;H01L27/105;H01L27/108;H01L27/11;H01L27/115;H01L29/417;H01L29/788;H01L29/792 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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