发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device achieving microfabrication with maintaining good characteristics at high yield. <P>SOLUTION: In a semiconductor device using an oxide semiconductor, contact resistance between the oxide semiconductor and source electrode/drain electrode is reduced with promoting microfabrication. In particular, by processing an oxide semiconductor film to form an island-shaped oxide semiconductor film having tapered lateral faces. A taper angle of the lateral face is not less than 1&deg; and less than 10&deg;. At least a part of the source electrode/drain electrode contacts the lateral face of the oxide semiconductor film. This configuration increases a contact region between the oxide semiconductor film and the source electrode/drain electrode thereby to reduce contact resistance. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013123044(A) 申请公布日期 2013.06.20
申请号 JP20120246515 申请日期 2012.11.08
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SASAGAWA SHINYA;FUJIKI HIROSHI
分类号 H01L29/786;H01L21/28;H01L21/336;H01L21/8242;H01L21/8244;H01L21/8247;H01L27/105;H01L27/108;H01L27/11;H01L27/115;H01L29/417;H01L29/788;H01L29/792 主分类号 H01L29/786
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