发明名称 FILM THICKNESS MEASURING METHOD FOR SURFACE LAYER OF ELECTROPHOTOGRAHIC SENSITIVE BODY
摘要 PROBLEM TO BE SOLVED: To provide a film thickness measuring method for the surface layer of an electrophotographic sensitive body that can precisely measure the thickness of the surface layer of an electrophotographic sensitive body having a dispersed filler as a specific layer which was hardly measured without being affected by the light diffusion by the filler and easily measure a surface layer which is relatively thin and has curvature and is suitable to even a surface layer with a small light absorption quantity. SOLUTION: The film thickness of the surface layer having the filler dispersed is measured by making thermal excitation light modulated intermittently in specific cycles determined by a film thermal property value incident on the surface of the surface layer having the dispersed filler and detecting the phase delay behind the modulation frequency of a generated sound wave.
申请公布号 JP2002277229(A) 申请公布日期 2002.09.25
申请号 JP20010079660 申请日期 2001.03.21
申请人 RICOH CO LTD 发明人 TOMOTA MITSUHIRO
分类号 G01B17/02;G01N29/00;G03G5/00;G03G5/05;G03G5/147;G03G21/00;(IPC1-7):G01B17/02 主分类号 G01B17/02
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