发明名称 |
FILM THICKNESS MEASURING METHOD FOR SURFACE LAYER OF ELECTROPHOTOGRAHIC SENSITIVE BODY |
摘要 |
PROBLEM TO BE SOLVED: To provide a film thickness measuring method for the surface layer of an electrophotographic sensitive body that can precisely measure the thickness of the surface layer of an electrophotographic sensitive body having a dispersed filler as a specific layer which was hardly measured without being affected by the light diffusion by the filler and easily measure a surface layer which is relatively thin and has curvature and is suitable to even a surface layer with a small light absorption quantity. SOLUTION: The film thickness of the surface layer having the filler dispersed is measured by making thermal excitation light modulated intermittently in specific cycles determined by a film thermal property value incident on the surface of the surface layer having the dispersed filler and detecting the phase delay behind the modulation frequency of a generated sound wave.
|
申请公布号 |
JP2002277229(A) |
申请公布日期 |
2002.09.25 |
申请号 |
JP20010079660 |
申请日期 |
2001.03.21 |
申请人 |
RICOH CO LTD |
发明人 |
TOMOTA MITSUHIRO |
分类号 |
G01B17/02;G01N29/00;G03G5/00;G03G5/05;G03G5/147;G03G21/00;(IPC1-7):G01B17/02 |
主分类号 |
G01B17/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|