发明名称 SENSITIVITY MEASURING DEVICE AND INSPECTION DEVICE
摘要 This sensitivity measuring device is provided with: a stage for placing a sample container; a temperature adjustment device that is provided with an upper heating body and a lower heating body, which are disposed above and below the sample container; and an image pickup device for picking up an image of the sample container, said image pickup device being provided with a lighting apparatus and an image pickup apparatus. Each of the upper heating body and the lower heating body has a structure wherein the temperature of a first region, a peripheral portion, is higher than the temperature of a second region including a center portion.
申请公布号 WO2016170930(A1) 申请公布日期 2016.10.27
申请号 WO2016JP59977 申请日期 2016.03.28
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MINEKAWA Hideaki;MAESHIMA Muneo;MASUYA Akira
分类号 C12M1/34;G01N21/01 主分类号 C12M1/34
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