发明名称 |
Laser production and product qualification via accelerated life testing based on statistical modeling |
摘要 |
<p>A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures (220) and wafer qualification (225) are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.</p> |
申请公布号 |
EP1734392(A2) |
申请公布日期 |
2006.12.20 |
申请号 |
EP20060117655 |
申请日期 |
2003.05.20 |
申请人 |
FINISAR CORPORATION |
发明人 |
MIAO, SONG;LEI, CHUN;CORNELIUS, RAJ;KLAJIC, ALEX |
分类号 |
H01L21/66;G01R31/26;H01S5/00 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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