发明名称 ARRANGEMENT FOR CORRECTING ABERRATIONS IN A MICROSCOPE
摘要 The invention relates to an arrangement for correcting aberrations of a specimen surface that vary across the visual field on a microscope, including a lens, a tubular lens, an imaging optics element, a pupil stop disposed in the beam path, and at least one optical element for optical-geometric separation of different image field regions. The optical element for optical-geometric separation of different image field regions is arranged in or near the intermediate image plane. Each individual element of the optical element for optical-geometric separation of different image field regions performs a pupil imaging, defined by the dimensions of the covered area of the intermediate image, such that a distribution of sub-pupils occurs, wherein each sub-pupil is allocated to the angle distribution from the associated image field region.
申请公布号 US2016320614(A1) 申请公布日期 2016.11.03
申请号 US201615135912 申请日期 2016.04.22
申请人 Carl Zeiss Microscopy GmbH 发明人 Wicker Kai
分类号 G02B27/00;G02B27/10;G02B21/18;G02B27/42 主分类号 G02B27/00
代理机构 代理人
主权项 1. A system for correcting aberrations of a specimen surface that vary across the visual field on a microscope, the system comprising a lens, a tubular lens, an imaging optics element, a pupil stop disposed in a beam path, and at least one optical element for optical-geometric separation of different image field regions, wherein the optical element for optical-geometric separation of different image field regions is arranged in or near an intermediate image plane and each individual element of the optical element for optical-geometric separation of different image field regions performs a pupil imaging, defined by the dimensions of the covered area of the intermediate image, such that a distribution of sub-pupils occurs, wherein each sub-pupil is allocated to an angle distribution from the associated image field region.
地址 Jena DE