发明名称 |
Method and system for systematic defect identification |
摘要 |
A method and apparatus for identifying suspect layout features from a plurality of layout features of an integrated circuit (IC) layout. A plurality of snippet images is generated, each of which depicts at least a portion of a suspect layout feature which is different from suspect layout features depicted in others of the plurality of snippet images. The suspect layout features are determined based on the diagnosis of a plurality of defective ICs manufactured in accordance with the IC layout. A plurality of clusters is generated, and each of the clusters contains a group of the plurality of snippet images based on similarities between the snippet images.
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申请公布号 |
US8509517(B2) |
申请公布日期 |
2013.08.13 |
申请号 |
US20100980703 |
申请日期 |
2010.12.29 |
申请人 |
BLANTON RONALD DESHAWN;TAM WING CHIU;CARNEGIE MELLON UNIVERSITY |
发明人 |
BLANTON RONALD DESHAWN;TAM WING CHIU |
分类号 |
G06K9/00;G06K9/46 |
主分类号 |
G06K9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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