发明名称 MEASUREMENT DEVICE, LITHOGRAPHY APPARATUS AND METHOD OF MANUFACTURING ARTICLE
摘要 PROBLEM TO BE SOLVED: To provide a measurement device advantageous in terms of throughput.SOLUTION: A measurement device for measuring the position of an object has a detector for detecting a mark formed on the object and generating a detection signal, and a processing unit for obtaining the position of the object based on the detection signal. The processing unit obtains the position of the object based on a part of the detection signal limited based on the information about the allowable conditions on the measurement accuracy for the object.SELECTED DRAWING: Figure 1
申请公布号 JP2016129212(A) 申请公布日期 2016.07.14
申请号 JP20150003608 申请日期 2015.01.09
申请人 CANON INC 发明人 EGASHIRA SHINICHI
分类号 H01L21/027;G01B11/00;G03F9/00 主分类号 H01L21/027
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