发明名称 |
MEASUREMENT DEVICE, LITHOGRAPHY APPARATUS AND METHOD OF MANUFACTURING ARTICLE |
摘要 |
PROBLEM TO BE SOLVED: To provide a measurement device advantageous in terms of throughput.SOLUTION: A measurement device for measuring the position of an object has a detector for detecting a mark formed on the object and generating a detection signal, and a processing unit for obtaining the position of the object based on the detection signal. The processing unit obtains the position of the object based on a part of the detection signal limited based on the information about the allowable conditions on the measurement accuracy for the object.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016129212(A) |
申请公布日期 |
2016.07.14 |
申请号 |
JP20150003608 |
申请日期 |
2015.01.09 |
申请人 |
CANON INC |
发明人 |
EGASHIRA SHINICHI |
分类号 |
H01L21/027;G01B11/00;G03F9/00 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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