发明名称 |
DYNAMIC DESIGN PARTITIONING FOR DIAGNOSIS |
摘要 |
Aspects of the invention relate to techniques for fault diagnosis based on dynamic circuit design partitioning. According to various implementations of the invention, a sub-circuit is extracted from a circuit design based on failure information of one or more integrated circuit devices. The extraction process may comprise combining fan-in cones of failing observation points included in the failure information. The extraction process may further comprise adding fan-in cones of one or more passing observation points to the combined fan-in cones of the failing observation points. Clock information of test patterns and/or layout information of the circuit design may be extracted and used in the sub-circuit extraction process. The extracted sub-circuit may then be used for diagnosing the one or more integrated circuit devices. |
申请公布号 |
US2016245866(A1) |
申请公布日期 |
2016.08.25 |
申请号 |
US201615146761 |
申请日期 |
2016.05.04 |
申请人 |
Mentor Graphics Corporation |
发明人 |
Tang Huaxing;Huang Yu;Cheng Wu-Tung;Benware Robert B.;Fan Xiaoxin |
分类号 |
G01R31/317;G01R31/3177 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
Wilsonville OR US |