发明名称 METHOD FOR MANUFACTURING FIN TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a fin transistor and a method for manufacturing a saddle-type fin transistor capable of preventing the upper portion of a fin from being lost in a formation step of a recess of a field oxide film. SOLUTION: The method for manufacturing a fin transistor includes a step for forming pad layers 22, 23 on a semiconductor substrate 21 using an element isolation mask 26, a step for etching the semiconductor substrate with the element isolation mask and the pad layers as the barriers to form a trench 24, a step for forming an isolated structure by embedding an insulator 25 in the trench, a step for etching the isolated structure using a gas of high selection ratio of the insulator to the pad layers to form the fin structure 27B, a step for forming a gate insulating film on the fin structure, and a step for forming a conductive layer on the gate insulating film. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008091871(A) 申请公布日期 2008.04.17
申请号 JP20070187840 申请日期 2007.07.19
申请人 HYNIX SEMICONDUCTOR INC 发明人 KIM KWANG-OK
分类号 H01L29/78;H01L21/3065;H01L21/308;H01L21/336 主分类号 H01L29/78
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