发明名称 Ferroelectric transistor, use thereof in a memory cell confuguration and method of producing the ferroelectric transistor
摘要 A ferroelectric transistor suitable as a memory element has a first gate intermediate layer and a first gate electrode disposed on the surface of a semiconductor substrate and disposed between source/drain regions. The first gate intermediate layer contains at least one ferroelectric layer. In addition to the first gate intermediate layer, a second gate intermediate layer and a second gate electrode are configured between the source/drain regions. The second gate intermediate layer contains a dielectric layer. The first gate electrode and the second gate electrode are connected to each other via a diode structure.
申请公布号 US2001038117(A1) 申请公布日期 2001.11.08
申请号 US20010801209 申请日期 2001.03.07
申请人 HANEDER THOMAS PETER;REISINGER HANS;STENGL REINHARD;BACHHOFER HARALD;WENDT HERMANN;HOENLEIN WOLFGANG 发明人 HANEDER THOMAS PETER;REISINGER HANS;STENGL REINHARD;BACHHOFER HARALD;WENDT HERMANN;HOENLEIN WOLFGANG
分类号 H01L21/8247;G11C11/22;H01L21/8246;H01L27/105;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 主分类号 H01L21/8247
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