发明名称 POLISHING METHOD, POLISHING DEVICE, AND SEMICONDUCTOR DEVICE PRODUCING METHOD
摘要 <p>A wafer (30) is polished by relatively moving a polishing body and the wafer (30) while applying a load between the polishing body and the wafer (30), with a polishing agent interposed between the polishing body and the wafer (30). A first step polishes the wafer (30) by using a hard polishing pad (42) as the polishing body while pressing the wafer (30) against the polishing pad (42) by air pressure. A second step following the first step uses a soft polishing pad as the polishing body to polish the wafer (30). This reduces erosion, dishing, etc., and provides a polished surface having few microscratches, further improving the flatness.</p>
申请公布号 WO2002056356(P1) 申请公布日期 2002.07.18
申请号 JP2002000009 申请日期 2002.01.07
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址