发明名称 LASER ANNEALING TECHNIQUE, SEMICONDUCTOR FILM, SEMICONDUCTOR DEVICE, AND ELECTROOPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a laser annealing technique that can highly crystallize the entire surface of an amorphous semiconductor film, hardly has granular crystal sections on nearly the entire surface of the amorphous semiconductor film, and can form a lateral crystal film without any joints, to provide a semiconductor film that has high crystallinity and is ideal as an active layer, or the like of a thin-film transistor (TFT) by using the technique, and to provide a semiconductor device, such as the TFT using the semiconductor film, and an electrooptical device. SOLUTION: Laser annealing is executed under conditions where a granular crystal part and an amorphous part are melted and a lateral crystal part is not melted. Further, laser annealing is executed by changing laser beam irradiation conditions in the granular crystal part from those in the amorphous part so that ¾EA-EP¾<¾EA-EPs¾... (1) is met, where EA is absorption light energy per unit area of laser beams at the amorphous part, EPs is absorption light energy per unit area of laser beams at the granular crystal part when laser beams are applied under the same laser beam irradiation conditions as those for the amorphous part, and EP is actual absorption light energy per unit area of laser beams at the granular crystal part. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008091510(A) 申请公布日期 2008.04.17
申请号 JP20060269030 申请日期 2006.09.29
申请人 FUJIFILM CORP 发明人 KURAMACHI TERUHIKO;SUNAKAWA HIROSHI;HIIRO HIROYUKI;TANAKA ATSUSHI
分类号 H01L21/20;G02F1/1345;G02F1/1368;H01L21/268;H01L21/336;H01L29/786 主分类号 H01L21/20
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