发明名称 |
SYSTEM AND METHOD FOR IDENTIFYING OPERATING TEMPERATURES AND MODIFYING OF INTEGRATED CIRCUITS |
摘要 |
Aspects of the present disclosure include a computer-implemented method for identifying an operating temperature of an integrated circuit (IC), the method including using a computing device for: applying a test voltage to a test circuit embedded within the IC, the test circuit including a phase shift memory (PSM) element therein, wherein the PSM element crystallizes at a crystallization temperature from an amorphous phase having a first electrical resistance into a crystalline phase having a second electrical resistance, the second electrical resistance being less than the first electrical resistance; and identifying the IC as having operated above the crystallization temperature in response to a resistance of the test circuit at the test voltage being outside of the target operating range. |
申请公布号 |
US2016240479(A1) |
申请公布日期 |
2016.08.18 |
申请号 |
US201514624907 |
申请日期 |
2015.02.18 |
申请人 |
GLOBALFOUNDRIES INC. |
发明人 |
Bickford Jeanne P.;Habib Nazmul;Li Baozhen;Wilder Tad J. |
分类号 |
H01L23/525;G01K7/16;H01L23/532;G01N25/00 |
主分类号 |
H01L23/525 |
代理机构 |
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代理人 |
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主权项 |
1. A computer-implemented method for identifying an operating temperature of an integrated circuit (IC), the method comprising using a computing device to perform actions including:
applying a test voltage to a test circuit embedded within the IC, the test circuit including a phase shift memory (PSM) element therein, wherein the PSM element crystallizes at a crystallization temperature from an amorphous phase having a first electrical resistance into a crystalline phase having a second electrical resistance, the second electrical resistance being less than the first electrical resistance; and identifying the IC as having operated above the crystallization temperature in response to a resistance of the test circuit at the test voltage being outside of the target operating range. |
地址 |
GRAND CAYMAN KY |