发明名称 |
HIGH ELECTRON MOBILITY TRANSISTOR SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device formation method that enables production of semiconductor devices suitable for sub-millimeter wave operation.SOLUTION: A photoresist layer is deposited on a semiconductor substrate 100; a window 106 is formed in the photoresist layer by electron beam lithography; a conformal layer is deposited on the photoresist and in the window 106; and substantially all of the conformal layer is selectively removed from the photoresist layer and a bottom portion of the window to form dielectric sidewalls 110 in the window 106.SELECTED DRAWING: Figure 1D |
申请公布号 |
JP2016157960(A) |
申请公布日期 |
2016.09.01 |
申请号 |
JP20160067988 |
申请日期 |
2016.03.30 |
申请人 |
NORTHROP GRUMMAN SYSTEMS CORP |
发明人 |
DANG LINH;YOSHIDA WAYNE;MEI XIAOBING;WANG JENNIFER;LIU PO-HSIN;LEE JANE;LIU WEIDONG;BARSKY MICHAEL;LAI RICHARD |
分类号 |
H01L21/338;H01L21/28;H01L29/417;H01L29/778;H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|