发明名称 HIGH ELECTRON MOBILITY TRANSISTOR SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device formation method that enables production of semiconductor devices suitable for sub-millimeter wave operation.SOLUTION: A photoresist layer is deposited on a semiconductor substrate 100; a window 106 is formed in the photoresist layer by electron beam lithography; a conformal layer is deposited on the photoresist and in the window 106; and substantially all of the conformal layer is selectively removed from the photoresist layer and a bottom portion of the window to form dielectric sidewalls 110 in the window 106.SELECTED DRAWING: Figure 1D
申请公布号 JP2016157960(A) 申请公布日期 2016.09.01
申请号 JP20160067988 申请日期 2016.03.30
申请人 NORTHROP GRUMMAN SYSTEMS CORP 发明人 DANG LINH;YOSHIDA WAYNE;MEI XIAOBING;WANG JENNIFER;LIU PO-HSIN;LEE JANE;LIU WEIDONG;BARSKY MICHAEL;LAI RICHARD
分类号 H01L21/338;H01L21/28;H01L29/417;H01L29/778;H01L29/812 主分类号 H01L21/338
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