发明名称
摘要 Systems and methods are disclosed for analyzing a sample using overlapping precursor isolation windows. A mass analyzer of a tandem mass spectrometer is instructed to select and fragment at least two overlapping precursor isolation windows across a precursor ion mass range of a sample using a processor. The tandem mass spectrometer includes a mass analyzer that allows overlapping precursor isolation windows across the mass range of the sample.
申请公布号 JP2013537312(A) 申请公布日期 2013.09.30
申请号 JP20130528779 申请日期 2011.09.14
申请人 发明人
分类号 G01N27/62 主分类号 G01N27/62
代理机构 代理人
主权项
地址