发明名称 METHOD FOR PATTERNING AN UNDERLYING LAYER
摘要 The present invention relates to a method for patterning an underlying layer. The method comprises the steps of: providing a guiding layer on the underlying layer, the guiding layer including guiding structures and being substantially planar; providing a block-copolymer layer on the guiding layer; inducing phase separation of the block-copolymer layer in a regular pattern of structures of a first polymer component and a second polymer component, whereby one of the components aligns to the guiding structures by chemo-epitaxy; thereafter, removing the first component of the block-copolymer layers completely, leaving a regular pattern of structures of the second component; providing a planarizing layer over the regular pattern of structures of the second component and the guiding layer; removing a portion of the planarizing layer, thereby leaving a regular pattern of structures of the planarizing layer at positions between the structures of the second component, and exposing the structures of the second component; removing the structures of the second component, selectively with respect to the structures of the planarizing layer; and patterning the underlying layer by using the structures of the planarizing layer as a mask.
申请公布号 KR20160105307(A) 申请公布日期 2016.09.06
申请号 KR20160020539 申请日期 2016.02.22
申请人 IMEC VZW 发明人 CHAN BOON TEIK;TAO ZHENG;VANDENBROECK NADIA;SAYAN SAFAK
分类号 H01L21/027;H01L21/02;H01L21/28;H01L21/3065;H01L21/56;H01L29/78 主分类号 H01L21/027
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