发明名称 RESIST COMPOSITION AND PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a resist composition that suppresses CD shrinkage or changes in a pattern profile with time and allows stable pattern formation, and a pattern forming method using the composition.SOLUTION: The resist composition comprises (A) a compound represented by formula (1) below, (B) a resin including a predetermined repeating unit, the solubility of which with an organic solvent-containing developing solution changes by an action of an acid, and (C) a photoacid generator. In formula (1), Rto Reach independently represent a hydrogen atom, a hydroxy group, or a linear, branched or cyclic monovalent hydrocarbon group having 1-20 carbon atoms which may have a hetero atom. Rto Rmay be bonded to each other to form a ring together with carbon atoms bonded thereto and a carbon atom therebetween.SELECTED DRAWING: None
申请公布号 JP2016206586(A) 申请公布日期 2016.12.08
申请号 JP20150091338 申请日期 2015.04.28
申请人 SHIN ETSU CHEM CO LTD 发明人 YAMADA KENJI;WATANABE SATOSHI
分类号 G03F7/004;C09K3/00;G03F7/038;G03F7/039;G03F7/32 主分类号 G03F7/004
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