发明名称 ABNORMALITY MONITORING SYSTEM AND PROGRAM
摘要 In order to determine a suitable reference value for monitoring abnormalities in a device, an abnormality monitoring device (10) is provided with a data acquisition interface (11) that acquires electrical output values that correspond to solar radiation intensity and with a monitoring unit (12). The monitoring unit (12) is provided with a calculation unit (121) that calculates average rates of change from two electrical output values from the interface (11) for every prescribed extraction period, with a filter unit (122) that extracts an electric power value for an average rate of change if the average rate of change is within a prescribed allowable range, and with a storage unit (123). The allowable range is among a plurality of allowable ranges for different times of a day and corresponds to a time. Each allowable range includes a reference rate of change, and the plurality of reference rates of change for the plurality of allowable ranges are an average rate of change for one clear sky day. The storage unit (123) stores extracted electrical output values as reference values together with corresponding time information.
申请公布号 WO2016166992(A1) 申请公布日期 2016.10.20
申请号 WO2016JP02068 申请日期 2016.04.15
申请人 PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. 发明人 KAZUNO, Hiroki
分类号 H02S50/00;G06Q50/06 主分类号 H02S50/00
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