发明名称 METHOD FOR CORRECTING MOVABLE HEAD POSITION OF X-Y SUBSTRATE INSPECTION DEVICE, AND X-Y SUBSTRATE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for correcting the movable head position of an X-Y substrate inspection device for correcting positional displacement by calculating an inclination on an X-Y plane of a Y-axis drive unit in X-Y substrate inspection devices that use a ball screw and a linear guide as the drive mechanism of a movable head, and also to provide and an X-Y substrate inspection device.SOLUTION: When reference mark sequences 22 and 23 with known coordinate positions are installed at both sides of the X axis direction, and a Y-axis drive unit 14 having a movable head 17 mounted thereon is moved to a target position in the X axis direction, a reference mark of the reference mark sequence 22 at one side is taken in with a camera 19 of the movable head 17 to calculate a distance between the position after movement and the reference mark. The Y-axis drive unit 14 is driven, a distance between the position after movement and a reference mark of the reference mark sequence 23 at the other side is calculated, and the inclination α of the Y-axis drive unit 14 is calculated from the calculated distance.SELECTED DRAWING: Figure 3
申请公布号 JP2016205957(A) 申请公布日期 2016.12.08
申请号 JP20150086858 申请日期 2015.04.21
申请人 HIOKI EE CORP 发明人 SHIOZAKI KAZUHIKO
分类号 G01B11/00;G05B19/404;H05K13/08 主分类号 G01B11/00
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