发明名称 |
METHOD FOR MANUFACTURING A CAPACITOR OF A SEMICONDUCTOR INTEGRATED CIRCUIT |
摘要 |
PURPOSE: A method for manufacturing a capacitor is provided, which prevents a progress badness occurrence happened when manufacturing a capacitor of MDL which an analog circuit is inserted. CONSTITUTION: The method for manufacturing a capacitor comprises the steps of: forming a first conductive film at a certain portion on an insulating film (200) which has a voluntary wire line; etching the first conductive film and forming a first wire line (102b) connected to the voluntary wire line and a lower electrode (202a); forming an insulating film between layers (204) on the insulating substrate (200) having the lower electrode (202a); etching the insulating film between layers (204) and forming a first bear hole (h1) in the insulating film (204); forming a dielectric film (206) in the bear hole (h1) and on the insulating film (204); forming a protecting film (208a) on the dielectric film (206); and forming a second wire line (202b) and an upper electrode (212a). Since the dielectric film can to be protected, the loss of the dielectric and a short occurrence between the upper electrode and lower electrode can to be prevented.
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申请公布号 |
KR20000010154(A) |
申请公布日期 |
2000.02.15 |
申请号 |
KR19980030910 |
申请日期 |
1998.07.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SOO CHEON |
分类号 |
H01L21/8236;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/8236 |
代理机构 |
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