发明名称 Plasma etching method
摘要 It is an object of the present invention to provide a plasma etching method that can improve a selection ratio of a film to be etched to a film different from the film to be etched than that in the related art. The present invention provides a plasma etching method for selectively etching a film to be etched with respect to another film different from the film to be etched, the plasma etching method including etching, using gas that can generate a deposited film containing components same as components of the another film different from the film to be etched, the film on which generation of the deposited film is suppressed.
申请公布号 US8580131(B2) 申请公布日期 2013.11.12
申请号 US201213363488 申请日期 2012.02.01
申请人 WATANABE TOMOYUKI;YAKUSHIJI MAMORU;MORIMOTO MICHIKAZU;ONO TETSUO;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 WATANABE TOMOYUKI;YAKUSHIJI MAMORU;MORIMOTO MICHIKAZU;ONO TETSUO
分类号 B44C1/22;C03C15/00;C03C25/68;C23F1/00 主分类号 B44C1/22
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