发明名称 Methods and Apparatus for Glass Removal in CMOS Image Sensors
摘要 Methods for glass removal while forming CMOS image sensors. A method for forming a device is provided that includes forming a plurality of pixel arrays on a device wafer; bonding a carrier wafer to a first side of the device wafer; bonding a substrate over a second side of the device wafer; thinning the carrier wafer; forming electrical connections to the first side of the device wafer; subsequently de-bonding the substrate from the second side of the device wafer; and subsequently singulating individuals ones of the plurality of pixel arrays from the device wafer. An apparatus is disclosed.
申请公布号 US2016197115(A1) 申请公布日期 2016.07.07
申请号 US201615070952 申请日期 2016.03.15
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chen Pao-Tung;Chen Szu-Ying;Yaung Dun-Nian;Liu Jen-Cheng
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. A method for forming a device, comprising: forming a first plurality of photo-sensitive elements in a semiconductor wafer, the semiconductor wafer disposed at a first major surface of a dielectric structure; forming a second plurality of photo-sensitive elements over a second major surface of the dielectric structure opposite the first major surface; bonding a substrate to the second major surface of the dielectric structure; thinning the semiconductor wafer at a first surface thereof to expose a conductive element formed within the semiconductor wafer; and forming electrical connections to the exposed conductive element at the first surface of the semiconductor wafer.
地址 Hsin-Chu TW