发明名称 |
Methods and Apparatus for Glass Removal in CMOS Image Sensors |
摘要 |
Methods for glass removal while forming CMOS image sensors. A method for forming a device is provided that includes forming a plurality of pixel arrays on a device wafer; bonding a carrier wafer to a first side of the device wafer; bonding a substrate over a second side of the device wafer; thinning the carrier wafer; forming electrical connections to the first side of the device wafer; subsequently de-bonding the substrate from the second side of the device wafer; and subsequently singulating individuals ones of the plurality of pixel arrays from the device wafer. An apparatus is disclosed. |
申请公布号 |
US2016197115(A1) |
申请公布日期 |
2016.07.07 |
申请号 |
US201615070952 |
申请日期 |
2016.03.15 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Chen Pao-Tung;Chen Szu-Ying;Yaung Dun-Nian;Liu Jen-Cheng |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A method for forming a device, comprising:
forming a first plurality of photo-sensitive elements in a semiconductor wafer, the semiconductor wafer disposed at a first major surface of a dielectric structure; forming a second plurality of photo-sensitive elements over a second major surface of the dielectric structure opposite the first major surface; bonding a substrate to the second major surface of the dielectric structure; thinning the semiconductor wafer at a first surface thereof to expose a conductive element formed within the semiconductor wafer; and forming electrical connections to the exposed conductive element at the first surface of the semiconductor wafer. |
地址 |
Hsin-Chu TW |