发明名称 PROBE OF SOCKET FOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a probe of socket for integrated circuits capable of restraining contact resistance value and acquiring stabilized characteristics. SOLUTION: When bumps of IC package are abutted against, a first terminal of the probe of socket for integrated circuits, where a plurality of chevron-shaped herring bone gears a to d, formed at the head point of a first terminal 12 so as to differ each height of the chevron-shaped herring-bone gears concerned, tilts to a cylindrical body 11 so as to contact internal perimeter of the aforementioned cylindrical body. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006343296(A) 申请公布日期 2006.12.21
申请号 JP20050171711 申请日期 2005.06.10
申请人 S II R:KK 发明人 WATABE TATSUKI;SHIRAKI MASATOSHI
分类号 G01R1/067;G01R1/073;G01R31/26;H01R13/24 主分类号 G01R1/067
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