| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a visual observation device successively, continuously, precisely and certainly performing the visual observation of a plurality of chip parts one by one at a high speed. Ž<P>SOLUTION: In the visual observation device, the arrangement quality of a plurality of the chip parts on a feed passage is determined on the basis of the output of a photoelectric sensor 10 for detecting the chip parts supplied on the feed passage from a part supply mechanism (determination means), and the chip part determined to be defective is excluded from the feed passage by the excluding mechanism provided on the upstream side of a camera for imaging the chip parts on the feed passage to be removed from the inspection target by the camera. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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