Automatic abutment for devices with horizontal pins

摘要

A system and method for optimizing a design layout by identifying features for abutment where shapes of the features that trigger the abutment are overlapping or within a predefined proximity of each other. The abutment process is implemented for features that have overlapping pins or that will have overlapping pins when abutted. Connectivity of abutted features is analyzed for the overlapped pins; pins of one of the abutted features are swapped so that at least one overlapping set of horizontal pins is connected to a same net; and a pin of the abutted features can be shortened as necessary to prevent short-circuit between pins connected to different nets. The overlapping pins are then merged. Pins can be shortened by cutting the pin or by adjusting pin style or pin size.

主权项

1. A method for using a processor to abut a plurality of features in an integrated circuit design layout, the method comprising:
identifying a set of features in the plurality of features, each feature in the set having pins perpendicular to a gate of said each feature, and adjacent features in the set having overlapped pins connected to different nets in the adjacent features; swapping a pair of pins of one of the adjacent features; if the adjacent features have overlapped pins connected to different nets after said swapping, shortening length of at least one pin of the overlapped pins; and merging overlapped pins that are not connected to different nets after said swapping.