MODIFYING A SCAN CHAIN FOR IMPROVED FAULT DIAGNOSIS OF INTEGRATED CIRCUITS

摘要

A computer program product for implementing a scan chain to test a semiconductor including one or more computer-readable storage media and program instructions stored on the one or more computer-readable storage media, the program instructions including: program instructions to obtain an initial structure of the scan chain, program instructions to determine, according to function modules of the semiconductor corresponding to scan registers on the scan chain, at least one scan register pair with backward dependency, program instructions to adjust the initial structure of the scan chain such that the at least one scan register pair with backward dependency becomes a scan register pair with forward dependency, and program instructions to determine a key subset of a fan-out scan register in the at least one scan register pair with backward dependency.

主权项

1. A computer program product for implementing a scan chain to test a semiconductor, the computer program product comprising:
one or more computer-readable storage media and program instructions stored on the one or more computer-readable storage media, the program instructions comprising:
program instructions to obtain an initial structure of the scan chain;program instructions to determine, according to function modules of the semiconductor corresponding to scan registers on the scan chain, at least one scan register pair with backward dependency;program instructions to adjust the initial structure of the scan chain such that the at least one scan register pair with backward dependency becomes a scan register pair with forward dependency;program instructions to determine a key subset of a fan-out scan register in the at least one scan register pair with backward dependency, wherein a fan-in scan register in the at least one scan register pair with backward dependency belongs to the key subset of the fan-out scan register,wherein logic values of all fan-in scan registers in the key subset and a logic value of an output of a function module connected to the fan-out scan register are the same, no matter which logic values are taken by fan-in scan registers outside the key subset.