发明名称 Methods for fabricating integrated circuits having substrate contacts and integrated circuits having substrate contacts
摘要 Methods for fabricating integrated circuits having substrate contacts and integrated circuits having substrate contacts are provided. One method includes forming a first trench in a SOI substrate extending through a buried insulating layer to a silicon substrate. A metal silicide region is formed in the silicon substrate exposed by the first trench. A first stress-inducing layer is formed overlying the metal silicide region. A second stress-inducing layer is formed overlying the first stress-inducing layer. An ILD layer of dielectric material is formed overlying the second stress-inducing layer. A second trench is formed extending through the ILD layer and the first and second stress-inducing layers to the metal silicide region. The second trench is filled with a conductive material.
申请公布号 US8609533(B2) 申请公布日期 2013.12.17
申请号 US201213436323 申请日期 2012.03.30
申请人 SCHEIPER THILO;FLACHOWSKY STEFAN;HOENTSCHEL JAN;GLOBALFOUNDRIES, INC. 发明人 SCHEIPER THILO;FLACHOWSKY STEFAN;HOENTSCHEL JAN
分类号 H01L21/311;H01L21/314;H01L21/3205;H01L21/4763 主分类号 H01L21/311
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