摘要 |
PROBLEM TO BE SOLVED: To provide a measuring method and a device for measuring simply deflection of a structure or a structure member. SOLUTION: A plurality of struts 2, 3 are erected on a measured object 1, and a wire rod 6 for measurement used as a reference is stretched horizontally, vertically or in parallel with the measured object between the struts. A measuring apparatus 10 is erected on a measuring position between the struts, and an optical sensor part 13 is moved up and down by a micrometer 12 provided on the measuring apparatus. The height of the wire rod for measurement when the sensor part detects the wire rod for measurement is measured by the micrometer, and the difference between the measured height by the micrometer and the reference height of the wire rod for measurement determined beforehand is determined, to thereby measure deflection of the measured object. COPYRIGHT: (C)2007,JPO&INPIT
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