| 摘要 |
The invention relates to a spectrometer arrangement ( 10 ) comprising a spectrometer ( 14 ) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector ( 42 ). Said arrangement also comprises: an Echelle grating ( 36 ) for the spectral decomposition of the radiation penetrating the spectrometer arrangement ( 10 ) in a main dispersion direction ( 46 ); a dispersing element ( 34 ) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction ( 48 ) which forms an angle with the main dispersion direction of the Echelle grating ( 36 ), in such a way that a two-dimensional spectrum ( 50 ) can be produced with a plurality of separated degrees ( 52 ); an imaging optical element ( 24, 38 ) for imaging the radiation penetrating through an inlet gap ( 20 ) into the spectrometer arrangement ( 10 ), in an image plane ( 40 ); and a surface detector ( 42 ) comprising a two dimensional arrangement of a plurality of detector elements in the image plane ( 40 ). The inventive arrangement is characterised in that another spectrometer ( 12 ) comprising at least one other dispersing element ( 64 ) and another imaging optical element ( 60,66 ) is provided in order to produce a spectrum ( 68 ) of a second wavelength range of radiation, which is different from the first wavelength range, from a radiation source on the same detector ( 42 ). The spectra can be spatially or temporally separated on the detector.
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