| 摘要 |
A layout design for a portion of a microdevice design is partitioned into sections or "bins." Next, a critical area value is estimated for one or more of the bins. One or more of these estimated bins is then selected for a more detailed analysis. After the estimated bins have been selected, a detailed critical area analysis of the selected bins is performed. Once the actual critical area for each of the estimated bins has been determined, the actual critical areas for selected estimated bins are correlated with those bin's corresponding estimated values. By correlating the actual critical areas of selected estimated bin to those bin's corresponding estimated values, a mapping function can be determined. After the mapping function has been determined, it is applied to the estimated values for each of the remaining bins of the layout design (i.e., the bins for which an actual critical area have not yet been determined) to obtain critical area information for the layout design. The layout design can then be modified based upon the obtained critical area information.
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