发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a technology of achieving easy control of impurity concentrations of an N well and a P well while decreasing a level difference of a boundary between the N well and the P well.SOLUTION: A manufacturing method of a semiconductor device having a twin well structure comprises: a first implantation process of performing ion implantation of a first conductivity type impurity into a semiconductor substrate in a first region and a second region which are adjacent to each other; a resist pattern formation process of forming a first resist pattern for covering the first region of the semiconductor substrate and exposing the second region of the semiconductor substrate; a second implantation process of performing ion implantation of a second conductivity type impurity of a concentration higher than that of the first conductivity type impurity to the second region of the semiconductor substrate by using the first resist pattern as a mask; and a diffusion process of thermally diffusing the first conductivity type impurity and the second conductivity type impurity. |
申请公布号 |
JP2014007385(A) |
申请公布日期 |
2014.01.16 |
申请号 |
JP20130086061 |
申请日期 |
2013.04.16 |
申请人 |
CANON INC |
发明人 |
SUZUKI NOBUYUKI;SUZUKI SATOSHI;UDA TOMOHIRO;OMURA MASANOBU;NAKAHARA TAKATOSHI;SASAKI KEIICHI |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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