| 发明名称 | Method for detecting environmental value in electronic device and electronic device | ||
| 摘要 | A method of detecting an environment vale of an electronic device is provided. The method includes measuring a state of one or more units related to the electronic device, determining a value based at least in part on the measured state of the one or more units related to the electronic device, determining an operation state of the electronic device according to the value, and generating an approximated environment value according to the operation state. Further, other various embodiments are available. | ||
| 申请公布号 | US9404812(B2) | 申请公布日期 | 2016.08.02 |
| 申请号 | US201414211680 | 申请日期 | 2014.03.14 |
| 申请人 | Samsung Electronics Co., Ltd. | 发明人 | Jang Yoon-Kyu;Jung Han-Sub;Lee Chee-Hoon;Park Jeong-Min;Chun Jae-Woong |
| 分类号 | G01K13/00;H04M1/725;G06F11/30 | 主分类号 | G01K13/00 |
| 代理机构 | Jefferson IP Law, LLP | 代理人 | Jefferson IP Law, LLP |
| 主权项 | 1. A method of detecting an environment value of an electronic device, the method comprising: measuring a state of one or more units related to the electronic device; determining a value based at least in part on the measured state of the one or more units related to the electronic device; determining an operation state of the electronic device according to the value; and generating an approximated environment value according to the operation state, wherein the operation state of the electronic device includes a low load state of the one or more units related to the electronic device and a high load state of the one or more units related to the electronic device, and wherein the determining of the operation state comprises: calculating a difference between a measured environment value and a state value of a specific unit among state values of one or more units. | ||
| 地址 | Suwon-si KR | ||