发明名称 MAGNETIC RANDOM ACCESS MEMORY CIRCUIT
摘要 PROBLEM TO BE SOLVED: To enable performing highly accurate and high speed read-out by preventing destruction of bias effect and tunnel barrier when voltage applied to a magneto resistive element is kept at a low level and a tunnel type magneto resistive element is used as a storage element. SOLUTION: Potentials of all connected sense line 121-124 and potentials of all work lines 133, 136 being not selected are kept at an equal potential, a selected work line 134 is grounded, a capacitor 114 previously charged to high voltage is connected to the sense line 122 through a MOS transistor 118 as a voltage drop element, and capacitor 114 is connected to them so that the capacitor 114 can discharge charged electric charges through the MOS transistor 118, the sense line 122, a magneto resistive element 142, and the word line 134.
申请公布号 JP2001325791(A) 申请公布日期 2001.11.22
申请号 JP20000142361 申请日期 2000.05.15
申请人 NEC CORP 发明人 NUMATA HIDEAKI;TAKEDA KOICHI
分类号 G11C11/14;G11C11/15;G11C11/16;H01L43/08;(IPC1-7):G11C11/15 主分类号 G11C11/14
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