发明名称 SELECTIVE GROWTH METHOD OF SOLID
摘要 PROBLEM TO BE SOLVED: To perform selective growth of a solid on a fine scale of nano meter with high accuracy in a short time, by readily conducting drawing of a high resolution pattern at a high speed and a low cost, when a solid s selectively grown on a substrate surface. SOLUTION: In this method for growing a solid selective in a defined region on a basic material 1, a silicon nitride film 2 formed on the substrate surface 1 is oxidized locally, according to a desired pattern until the basic material 1 is reached to form a locally oxidized part 3, the locally oxidized part 3 is removed by etching, to form a recessed region 9 exposing the substrate surface 1 on the bottom part 9a thereof, the surfaces of at least the recessed region 9 and the silicon nitride film 2 in the vicinity thereof are coated with silicon dioxide 5 to forma two layer mask, the substrate surface is exposed as a defined region on the bottom part 9a of the recessed region 9, and a solid is selectively grown in the defined region.
申请公布号 JP2001326188(A) 申请公布日期 2001.11.22
申请号 JP20000179094 申请日期 2000.05.12
申请人 NATL INST OF ADVANCED INDUSTRIAL SCIENCE & TECHNOLOGY METI;KA SHOSHI 发明人 YASUDA TETSUJI;YAMAZAKI SATOSHI;KA SHOSHI
分类号 B82B3/00;C23C16/30;H01L21/205;H01L21/316;H01L21/318;(IPC1-7):H01L21/205 主分类号 B82B3/00
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