发明名称 Methods and structures for capping a structure with a protective coating
摘要 A surface is placed into a deposition chamber. A tin layer is formed on the surface, in which forming the tin layer includes providing a precursor into the deposition chamber for a first time period, wherein the precursor comprises one of tetrakis (dimethylamino) tin (TDMASn) or tin tetrachloride (SnCl4), providing an inert gas into the deposition chamber for a second time period, providing a hydrogen reactant into the deposition chamber for a third time period, and providing the inert gas into the deposition chamber for a fourth time period. The first, second, third, and fourth time periods form one atomic layer deposition (ALD) cycle. The surface may be an exposed surface of a lead free metal.
申请公布号 US8637393(B1) 申请公布日期 2014.01.28
申请号 US201213661377 申请日期 2012.10.26
申请人 HEGDE RAMA I.;FREESCALE SEMICONDUCTOR, INC. 发明人 HEGDE RAMA I.
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
主权项
地址