发明名称 PORTABLE ULTRASONIC TESTING DEVICE AND ULTRASONIC TESTING METHOD
摘要 A portable ultrasonic testing device which with respect to a plate material having a chamfered surface formed between an outer plate surface and an inner peripheral surface, irradiates the chamfered surface with ultrasonic waves while moving along the chambered surface to thereby detect flaws in the plate material is provided with: a device frame; a probe which irradiates the chambered surface with the ultrasonic waves, and receives reflected ultrasonic waves; a wedge to which the probe is fixed and which is able to come into contact with the chamfered surface; a slide mechanism which moves the wedge in a sliding direction with respect to the device frame; a spring member which is urged in a direction in which the wedge and the chamfered surface approach each other in the sliding direction; and a movable roller and a pair of fixed rollers which are provided in the device frame and each have a rolling contract surface that is in contact with the inner peripheral surface.
申请公布号 US2016231283(A1) 申请公布日期 2016.08.11
申请号 US201415027249 申请日期 2014.09.03
申请人 MITSUBISHI HEAVY INDUSTRIES, LTD. 发明人 TAKEMOTO Hiroshi;UESHIRO Kazuhiro;KIMURA Tadayoshi
分类号 G01N29/04;G01N29/24 主分类号 G01N29/04
代理机构 代理人
主权项 1. A portable ultrasonic testing device that with respect to an object to be inspected having a surface to be inspected formed between a first surface and a second surface, irradiates the surface to be inspected with ultrasonic waves while moving along the surface to be inspected so as to detect flaws in the object to be inspected, the device comprising: a device frame; a probe that irradiates the surface to be inspected with ultrasonic waves and receives reflected ultrasonic waves; a wedge to which the probe is fixed and that is able to come in contact with the surface to be inspected; a slide mechanism that moves the wedge in a sliding direction with respect to the device frame; an urging member that urges the wedge so that the wedge and the surface to be inspected approach each other in the sliding direction; and a guide member that is provided in the device frame and has a second contact surface that comes into contact with the second surface.
地址 Minato-ku, Tokyo JP