发明名称 Method of manufacturing an SOI (silicon on insulator ) wafer
摘要 This invention is to manufacturing of SOI (Silicon On Insulator) wafer; with respect to manufacturing of SOI wafer, preparation process of silicon wafer with desired thickness (100), deposition of Alumina(Al2O3) as insulator by an ALE (Atomic Layer Epitaxial) method such as ALCVD, ALD, ASCVD, etc . . . (110), bonding of this wafer with another silicon wafer by various bonding methods (120), Cutting of this bonded wafer by various methods of cutting(130), Polishing the surface of the cut wafer (140). For the insulator material, titanium oxide (TiO2) or tantalum oxide(Ta2O5) can be used other than Alumina(Al2O3) and such bonding process can be done by unibonding method and cutting method can be done by Smart Cut process.
申请公布号 US2002094663(A1) 申请公布日期 2002.07.18
申请号 US20010963440 申请日期 2001.09.27
申请人 KWON YONG-BUM;LEE JONG-HYUN 发明人 KWON YONG-BUM;LEE JONG-HYUN
分类号 H01L27/12;H01L21/02;H01L21/762;(IPC1-7):H01L21/00;H01L21/30;H01L21/31;H01L21/46;H01L21/469;H01L21/76;H01L21/84 主分类号 H01L27/12
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