发明名称 PROBE CLEANER AND CLEANING METHOD
摘要 A probe cleaner and a cleaning method thereof are provided to clean a tip of probe without causing wear of the probe while cleaning, particularly for the tip of probe with unevenness. A cleaning method of a probe cleaner(20) for removing foreign substances attached onto a tip of probe, comprises the steps of: installing the probe cleaner on a surface of a table, wherein the probe cleaner comprises a cleaner sheet(21) having a surface(24) made of micro fibers(25) and abrading particles(26) fixed onto a surface of the micro fibers at the surface; poking the tip of the probe into the surface, and reciprocating the prove in a direction of thickness of the surface.
申请公布号 KR20080025326(A) 申请公布日期 2008.03.20
申请号 KR20070093350 申请日期 2007.09.14
申请人 NIHON MICRO COATING CO., LTD. 发明人 TAMURA JUNE;KATO KENJI
分类号 H01L21/66 主分类号 H01L21/66
代理机构 代理人
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