| 摘要 |
<p>A testing apparatus for testing a plurality of electronic devices at the same time, comprising a plurality of logical comparison circuits associated with the respective ones of the plurality of electronic devices for serially outputting fail information for each of the pins of the associated electronic devices; a serial reading part for serially reading, for the respective pins, the fail information as determined by the logical comparison circuits; a logical sum part for calculating a logical sum of the fail information as read by the serial reading part for each electronic device and generating device fail information for each electronic device; and a logical product part for calculating a logical product of the device fail information as generated by the logical sum part and generating total fail information indicative of fail when all of the device fail information indicate fail.</p> |
