Data Storage Component Test Deck

摘要

A test deck may be employed as part of a data storage component testing system. A test deck can consist of at least a bottom cover mating to a top cover to define an enclosed testing region configured to house a data storage medium, transducing head, and head suspension. The top cover may have an access port occupied by a door providing access to the enclosed testing region.

主权项

1. An apparatus comprising a bottom cover mating to a top cover to define an enclosed testing region, the top cover comprising an access port sized to accommodate a single data storage component passing therethrough, the access port occupied by a door closing the access port, the bottom cover comprising a recess occupied by a printed circuit board, the enclosed testing region configured to house a data storage medium, transducing head, and head suspension, the printed circuit board comprising a controller configured to log biographical testing conditions within the enclosed testing region.