发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device whose manufacturing process is not complicated and whose cost can be suppressed by forming a thin film transistor using an oxide semiconductor film represented by zinc oxide, and a manufacturing method thereof. <P>SOLUTION: This semiconductor device has a transistor that comprises a gate electrode arranged on a substrate, a gate insulating film arranged on the gate electrode, and an oxide semiconductor film arranged on the gate insulating film. Heat treatment is performed at least to the channel formation region of the oxide semiconductor film. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
申请公布号 |
JP2009021612(A) |
申请公布日期 |
2009.01.29 |
申请号 |
JP20080200670 |
申请日期 |
2008.08.04 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
AKIMOTO KENGO;HONDA TATSUYA;SONE HIROTO |
分类号 |
H01L29/786;G02F1/1368;H01L21/20;H01L21/336;H01L51/50 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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